机读格式显示(MARC)
- 000 01573nam2 2200337 4500
- 008 870804s1987 waua b 101 0 eng
- 050 00 |a TK7881 |b .I55 1987a
- 090 __ |a TN-53/E12:2(87)
- 111 2_ |a International Conference on Industrial Electronics, Control, and Instrumentation |n ( |d 1987 : |c Cambridge, Mass.)
- 245 10 |a IECON '87 :signal acquisition and processing/ |c 1987 International Conference on Industrial Electronics, Control, and Instrumentation ; sponsored by IEEE Industrial Electronics Society in association with Society of Instrument and Control Engineers of Japan and SPIE--the International Society for Optical Engineering.
- 260 __ |a Bellingham, Wash., USA : |b SPIE, |c c1987.
- 300 __ |a viii, 965-1155 p. : |b ill. ; |c 28 cm.
- 490 1_ |a Proceedings / SPIE ; |v v. 858
- 504 __ |a Includes bibliographical references and indexes.
- 650 _0 |a Industrial electronics |v Congresses.
- 710 2_ |a Keisoku Jidō Seigyo Gakkai (Japan)
- 710 2_ |a Society of Photo-optical Instrumentation Engineers.
- 710 2_ |a IEEE Industrial Electronics Society.
- 830 _0 |a Proceedings of the Society of Photo-optical Instrumentation Engineers ; |v v. 853-858.
- 905 __ |a XATU |d TN-53/E12:2(87)
- 950 __ |a 261060 |f TN-53/E12:2(87)
- 999 __ |t C |A shenxiaoyan |a 20060824 10:58:21 |M shenxiaoyan |m 20060824 11:05:29 |G shenxiaoyan |g 20060824 11:06:0