机读格式显示(MARC)

• 000 01055nam2 2200325 4500

• 000 1000002278

• 001 0000158734

• 003 CAL

• 008 751229s1976 nyu b 001 0 eng

• 010 __ |a 75045196 //r90

• 020 __ |a 0080196926 |c CNY1.40

• 040 __ |a DLC |c XAIT

• 050 00 |a QD945 |b .T36 1976

• 082 00 |a 548/.83

• 090 __ |a O434.1/E2

• 093 __ |a O434.1 |2 4

• 099 __ |a CAL 022000292191 |a CAL 022000332993

• 100 1_ |a Tanner, B. K. |q (Brian Keith)

• 245 10 |a X-ray diffraction topography / |c by B. K. Tanner.

• 260 __ |a New York : |b Pergamon Press, |c 1976.

• 300 __ |a xiii, 174 p. ; |c 26 cm.

• 490 0_ |a Pergamon international library

• 490 0_ |a International series in the science of the solid state ; v. 10

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a X-ray crystallography.

• 905 __ |a XATU |d O434.1/E2

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f O434.1/E2

• 991 __022004002300

• 999 __ |t C |A shenxiaoyan |a 20040921 09:53:41 |M shenxiaoyan |m 20040921 09:54:48 |G shenxiaoyan |g 20040921 09:55:1