机读格式显示(MARC)

• 000 01569nam2 2200373 4500

• 000 1000002255

• 001 0000158711

• 003 CAL

• 008 890818s1989 waua b 101 0 eng

• 010 __ |a 89043274

• 020 __ |a 0819402001 |c CNY25.50

• 040 __ |a DLC |c XAIT

• 050 00 |a TA418.7 |b .S794 1989

• 082 00 |a 620/.44 |2 20

• 090 __ |a O43-53/E31:(89)

• 093 __ |a O43-53 |2 4

• 099 __ |a CAL 022000222716 |a CAL 022000349654

• 245 00 |a Surface characterization and testing II : |b 10-11 August 1989, San Diego, California / |c John E. Greivenkamp, Matt Young, chairs/editors.

• 260 __ |a Bellingham, Wash., USA : |b SPIE--the International Society for Optical Engineering, |c c1989.

• 300 __ |a vi, 271 p. : |b ill. ; |c 28 cm.

• 490 1_ |a Proceedings / SPIE--the International Society for Optical Engineering ; |v v. 1164

• 500 __ |a "Sponsored by SPIE--the International Society for Optical Engineering."

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Surfaces (Technology) |x Optical properties |v Congresses.

• 650 _0 |a Surfaces (Technology) |x Testing |v Congresses.

• 700 1_ |a Young, Matt, |d 1941-

• 700 1_ |a Greivenkamp, John E.

• 710 2_ |a Society of Photo-optical Instrumentation Engineers.

• 830 _0 |a Proceedings of SPIE-the International Society for Optical Engineering ; |v v. 1164.

• 905 __ |a XATU |d O43-53/E31:(89)

• 920 __ |a 261060 |z 1

• 950 __ |a 261060 |f O43-53/E31:(89)

• 991 __022004002277

• 999 __ |t C |A shenxiaoyan |a 20040920 16:05:13 |M shenxiaoyan |m 20040920 16:06:21 |G shenxiaoyan |g 20040920 16:06:4