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西文图书1.Autotestcon '85 / TM93-53/E1:(85)
馆藏复本:1
可借复本:1 proceedings, Long Island, N.Y., October 22-24, 1985, IEEE International Automatic Testing Conference
IEEE ; c1985.
(0) 馆藏
馆藏复本:1
可借复本:1 proceedings, Long Island, N.Y., October 22-24, 1985, IEEE International Automatic Testing Conference
IEEE ; c1985.
(0) 馆藏