检索到 1 条 责任者=Society of Photo-optical Instrumentation Engineers. 索书号=O 主题=surfaces technology 的结果
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西文图书1.Surface characterization and testing II : 10-11 August 1989, San Diego, California / O43-53/E31:(89)
馆藏复本：2
可借复本：2 John E. Greivenkamp, Matt Young, chairs/editors.
SPIE--the International Society for Optical Engineering, c1989.
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