检索到 1 条 责任者=Society of Photo-Optical Instrumentation Engineers. 主题=mensuration 文献类型=西文图书 的结果
-
西文图书1.Integrated circuit metrology, inspection, and process control VI : 9-11 March 1992, San Jose, Califo TN407-53/E2:1673(92)
馆藏复本：1
可借复本：1 Michael T. Postek, chair/editor ; sponsored and published by SPIE--the International Society for Opt
SPIE, c1992.
(0) 馆藏
