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西文图书1.Fault detection in digital circuits /
馆藏复本:1
可借复本:1 Arthur D. Friedman, Premachandran R. Menon.
Prentice-Hall, c1971.
(0) 馆藏 -
西文图书2.Digital systems testing and testable design = 数字系统测试和可测性设计 / TN431.2/10E
馆藏复本:8
可借复本:8 Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
清华大学出版社, c2004.
(0) 馆藏