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题名/责任者:

Analytical eletron microscopy 1984 proceedings of a Workshop held at Bethlehem, Pennsylvania, 16-20 July 1984 editors, D. B. Williams, D. C. Joy, sponsored by microbeam analysis society co-sponsored by department of metallurgy and meterials engineering meterials research center, lehigh university North East Tier Ben Franklin Technology Center, The metalssociety(Great Britain)

出版发行项:

San Francisco, CA The Francisco Press, Inc. 1984.

载体形态项:

vi, 378 p. ill. 30 cm

附加个人名称:

Joy, D. C.

附加个人名称:

Williams, D. B.

论题主题:

Analytical eletron microscopy.

中图法分类号:

TG115.21

书目附注:

Includes bibliographical references and index.

豆瓣简介：