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题名/责任者:

Diffraction and imaging techniques in material science, v.1 : electron microscopy / editors, S. Amelinckx, R. Gevers, J. Van Landuyt.

版本说明:

2d, rev. ed.

出版发行项:

Amsterdam ; New York : North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1978.

ISBN:

0444851305

载体形态项:

453 p. : ill. ; 23 cm.

附加个人名称:

Gevers, R.

附加个人名称:

Landuyt, J. van.

附加个人名称:

Amelinckx, S. (Severin)

附加会议名称:

International Summer Course on Material Science (1969 : Antwerp, Belgium). Modern diffraction and imaging techniques in material science.

论题主题:

Electrons-Diffraction-Congresses.

论题主题:

Imaging systems-Congresses.

论题主题:

Electron microscopy-Congresses.

中图法分类号:

TB302

一般附注:

Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science.

书目附注:

Includes bibliographical references and index.

内容附注:

v. 1. Electron microscopy.--v. 2. Imaging and diffraction techniques.

豆瓣简介：