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题名/责任者:

Reliability physics 1981 : 19th annual proceedings, April 7-9, 1981 / Sponsored by the IEEE Electron Device Group and the IEEE Reliability Group.

出版发行项:

New York, N.Y. : Electron Devices and Reliability Societies of the Institute of Electrical and Electronics Engineers, 1981.

载体形态项:

310 p. : ill. ; 28 cm.

起止卷期:

Began with vol. for 1970.

先前出版物:

Reliability Physics Symposium. Proceedings

会议名称:

International Reliability Physics Symposium (19th : 1981 : Orlando)

附加团体名称:

IEEE Reliability Society.

附加团体名称:

Institute of Electrical and Electronics Engineers. Electron Devices Group.

附加团体名称:

IEEE Electron Devices Society.

附加团体名称:

IEEE Reliability Group.

论题主题:

Integrated circuits-Reliability-Congresses.

论题主题:

Integrated circuits-Testing-Congresses.

论题主题:

Electronic apparatus and appliances-Reliability-Congresses.

论题主题:

Electronic apparatus and appliances-Testing-Congresses.

中图法分类号:

O4-53/E1;(81)

出版周期:

Annual

一般附注:

Cover title: IEEE 1980 international reliability physics.

书目附注:

Includes bibliographical references.

引文/参考附注:

Index to IEEE publications 0099-1368

豆瓣简介：