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题名/责任者:

Metrology of optoelectronic systems : 21-22 May 1987, Orlando, Florida / Edward M. Granger, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Center for Applied Optics/University of Alabama in Huntsville ... et al. .

出版发行项:

Bellingham, Wash., USA : SPIE, c1987.

ISBN:

0892528117 (pbk.)

载体形态项:

vi, 123 p. : ill. ; 28 cm.

丛编题名:

Proceedings of SPIE--the International Society for Optical Engineering ; v. 776

附加个人名称:

Granger, Edward M.

附加团体名称:

Society of Photo-optical Instrumentation Engineers. University of Alabama in Huntsville. Center for Applied Optics.

论题主题:

Optical measurements-Congresses.

论题主题:

Optoelectronic devices-Measurement-Congresses.

中图法分类号:

O463

书目附注:

Includes bibliographies and index.

豆瓣简介：