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题名/责任者:

Optical characterization techniques for semiconductor technology : April 1-2, 1981, San Jose, California / D.E. Aspnes, S. So, R.F. Potter, editors.

出版发行项:

Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, 1981.

ISBN:

0892523093 (pbk.)

载体形态项:

x, 262 p. : ill. ; 28 cm.

丛编题名:

Proceedings of the Society of Photo-optical Instrumentation Engineers ; v. 276

附加个人名称:

So, S. (Samuel S.)

附加个人名称:

Potter, Roy F.

附加个人名称:

Aspnes, D.E.

论题主题:

Semiconductors-Testing-Optical methods-Congresses.

中图法分类号:

TN3-53

书目附注:

Includes bibliographical references and indexes.

豆瓣简介：